首页> 外国专利> Method for high resolution interferential measurement of the spacing to a reflector in which case a light receiver produces a signal which is evaluated by a signal processing unit, e.g. for digital scales

Method for high resolution interferential measurement of the spacing to a reflector in which case a light receiver produces a signal which is evaluated by a signal processing unit, e.g. for digital scales

机译:用于对反射器的间距进行高分辨率干涉测量的方法,在这种情况下,光接收器产生信号,该信号由信号处理单元(例如信号处理单元)评估。用于电子秤

摘要

The method is for high resolution interferential measurement of the spacing to a reflector whose stroke is a measure for the value initiating the stroke, through photo diode (FD) elements consisting of a light transmitter and light receiver, the signals produced being evaluated in signal processing electronics. The light transmitter is integrated in a photo diode array and is on the front side of a transparent plate, preferably glass. An LED or diode laser is integrated into the radiation sensor array on a silicon chip (Ch). Light from the LED produces reflected light interference by a partial metallized reverse side of the glass plate and reflector (S), and the photo diode array receives bright/dark cycles as a measure of the reflector position. An Independent claim is included for a measurement device implementing the above method.
机译:该方法用于高分辨率反射物到反射器的间距的干涉测量,该反射器的行程是测量行程值的手段,它通过由光发射器和光接收器组成的光电二极管(FD)元件进行测量,产生的信号在信号处理中进行评估电子产品。光发射器集成在光电二极管阵列中,并且位于透明板(最好是玻璃)的正面。 LED或二极管激光器集成到硅芯片(Ch)上的辐射传感器阵列中。来自LED的光通过玻璃板和反射镜(S)的部分金属化背面产生反射光干涉,并且光电二极管阵列接收亮/暗循环作为反射镜位置的度量。对于实施上述方法的测量设备包括独立权利要求。

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