首页> 外国专利> Functional test of calculation devices in the course of manufacture of functional tests based on firmware applied by means of the port of the developed by the emulation device.

Functional test of calculation devices in the course of manufacture of functional tests based on firmware applied by means of the port of the developed by the emulation device.

机译:在基于硬件的功能测试制造过程中,计算设备的功能测试通过仿真设备开发的端口进行应用。

摘要

The present invention relates to a test system in the course of manufacture in order to test a computing system (39), comprising a calculation device (36) to (37) of the point in the emulation accessible through a port (38) of the point in the emulation, by applying functional tests on the basis of the device by the port firmware. It comprises a functional test (35) based on a microprogram; and a probe (34) of calculation system which communicates with the device by the port for controlling an embodiment and to modify and to recover the values of internal state of the calculation system, the probe which, via the port, apply the functional test to the system of calculation and control the execution of the test at each level of integration test of such a system. Preferably, a host computer (32) can send the test to the probe. The present invention also relates to a corresponding method.
机译:[0001]本发明涉及一种在制造过程中的测试系统,以测试计算系统(39),该测试系统包括可通过计算机的端口(38)访问的仿真中的点的计算设备(36)至(37)。通过在端口固件的基础上对设备进行功能测试,可以在仿真中指出问题。它包括基于微程序的功能测试(35);计算系统的探针(34),其通过用于控制实施例的端口与设备通信并修改和恢复计算系统的内部状态值,该探针经由端口将功能测试应用于在这样一个系统的集成测试的每个级别上计算和控制测试执行的系统。优选地,主机(32)可以将测试发送到探针。本发明还涉及相应的方法。

著录项

  • 公开/公告号FR2760534B1

    专利类型

  • 公开/公告日2000-05-26

    原文格式PDF

  • 申请/专利权人 HEWLETT PACKARD COMPANY;

    申请/专利号FR19970015932

  • 发明设计人 TEGETHOFF MAURO V;

    申请日1997-12-16

  • 分类号G01R31/3177;G01R31/3181;

  • 国家 FR

  • 入库时间 2022-08-22 01:40:00

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