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On-the-fly optical interference measurement device, machining device provided with the measurement device, and machine tool suited to on-the- fly optical measurement

机译:实时光学干涉测量装置,具有该测量装置的机械加工装置以及适合进行实时光学测量的机床

摘要

In a machining device, a workpiece is laid on a working mechanism base and a lapping machine laid on the workpiece is operated to rotate. A lap liquid is supplied between the lapping machine and the workpiece. The lapping machine is provided with a plurality of holes as measurement windows. Above the workpiece, an interferometer is disposed on the opposite side of the lapping machine from the workpiece. The interferometer detects interference fringes on a machined surface of the workpiece through the measurement windows. Based on detection results, the rotation of the lapping machine and the position of the workpiece are controlled.
机译:在机械加工装置中,将工件放置在工作机构基座上,并且使放置在该工件上的研磨机旋转。在研磨机和工件之间供给研磨液。研磨机设置有多个孔作为测量窗。在工件上方,干涉仪设置在研磨机的与工件相反的一侧。干涉仪通过测量窗口检测工件加工表面上的干涉条纹。根据检测结果,控制研磨机的旋转和工件的位置。

著录项

  • 公开/公告号US5999264A

    专利类型

  • 公开/公告日1999-12-07

    原文格式PDF

  • 申请/专利权人 MITUTOYO CORPORATION;

    申请/专利号US19980103116

  • 发明设计人 HIROHISA HANDA;

    申请日1998-06-23

  • 分类号G01B9/02;

  • 国家 US

  • 入库时间 2022-08-22 01:38:44

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