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Methods, apparatus and computer program products for determining equivalencies between integrated circuit schematics and layouts using color symmetrizing matrices

机译:用于使用颜色对称矩阵确定集成电路原理图和布局之间的等效性的方法,装置和计算机程序产品

摘要

A layout versus schematic (LVS) comparison tool determines one- to- one equivalency between an integrated circuit schematic and an integrated circuit layout by performing operations to generate color symmetrizing matrices corresponding to respective child cells in the integrated circuit schematic. Here, the child cells are characterized as having a number of symmetrical configurations which at a port level are electrically equivalent. Operations are also performed to generate a first color symmetry vector for a child cell in the integrated circuit schematic and a second color symmetry vector for the corresponding child cell in the integrated circuit layout. A vector equivalency is also preferably determined by comparing a product of the color symmetrizing matrix and the first color symmetry vector against a product of the color symmetrizing matrix and the second color symmetry vector. Notwithstanding the presence of a vector equivalency, a possibility may still exist that with respect to the corresponding symmetric child cells in the schematic and layout, isomorphism between the schematic and layout is not present. To address this possibility, an operation is preferably performed to detect the absence of a spurious symmetry in the color symmetrizing matrix. If an absence is detected, the presence of the vector equivalency will unequivocally establish the one-to-one correspondence with respect to the child cells being analyzed. Thus, the need to perform a computationally expensive membership test to determine whether a selected permutation can be derived from valid symmetries, can be successfully eliminated. The preferred comparison tool also infers symmetries, where available, so that symmetries of a child cell may be propagated to a parent cell when the tool is evaluating a grandparent cell containing the parent cell.
机译:布局与示意图(LVS)比较工具通过执行操作来生成与集成电路示意图中各个子单元相对应的颜色对称矩阵,从而确定了集成电路示意图和集成电路布局之间的一对一等效性。在此,子单元的特征在于具有多个对称的构造,这些对称的构造在端口水平上是等效的。还执行操作以生成集成电路示意图中的子单元的第一颜色对称矢量和集成电路布局中的相应子单元的第二颜色对称矢量。还优选通过将颜色对称矩阵与第一颜色对称向量的乘积与颜色对称矩阵与第二颜色对称向量的乘积进行比较来确定向量等效性。尽管存在向量等效项,但对于原理图和布局中的相应对称子单元,仍然可能不存在原理图和布局之间的同构。为了解决这种可能性,优选地执行操作以检测颜色对称矩阵中不存在伪对称。如果检测到缺失,则向量等效性的存在将明确地建立与被分析子细胞的一一对应关系。因此,可以成功地消除执行计算量大的成员资格测试以确定是否可以从有效对称中导出选定排列的需求。优选的比较工具还可以推断对称性(如果可用),以便在该工具评估包含父单元格的祖父母单元格时,子单元格的对称性可以传播到父级细胞。

著录项

  • 公开/公告号US6009252A

    专利类型

  • 公开/公告日1999-12-28

    原文格式PDF

  • 申请/专利权人 AVANT!CORPORATION;

    申请/专利号US19980035271

  • 发明设计人 GARY BRUCE LIPTON;

    申请日1998-03-05

  • 分类号G06F17/16;G06F17/00;G06F15/00;

  • 国家 US

  • 入库时间 2022-08-22 01:38:26

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