首页> 外国专利> Methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for window retardence, in ellipsometer and polarimeter systems

Methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for window retardence, in ellipsometer and polarimeter systems

机译:椭偏仪和旋光仪系统中用于窗口延迟的参数化数学模型方程中参数的不相关评估方法

摘要

Disclosed is a method for evaluating parameters in parameterized equations for independently calculating retardence entered to orthogonal components in a beam of electromagnetic radiation which is caused to pass through spatially separated input and output windows, by each of said input and output windows. The present invention finds application in ellipsometric investigation of sample systems present in vacuum chambers, wherein a beam of electromagnetic radiation is caused to pass through an input window, interact with a sample system, and exit through an output window, and where it is necessary to separate out the effects of said input and output windows to arrive at sample system characterizing results.
机译:公开了一种用于评估参数化方程式中的参数的方法,该方法用于独立地计算输入到电磁辐射束中的正交分量的延迟,该电磁辐射束通过所述输入和输出窗口中的每一个经过空间分离的输入和输出窗口。本发明可用于椭圆腔法中对存在于真空室中的样品系统的研究中,其中使电磁辐射束穿过输入窗口,与样品系统相互作用,并通过输出窗口出射,并且在需要时分离出所述输入和输出窗口的效果,以得出表征结果的样本系统。

著录项

  • 公开/公告号US6034777A

    专利类型

  • 公开/公告日2000-03-07

    原文格式PDF

  • 申请/专利权人 J.A. WOOLLAM CO. INC.;

    申请/专利号US19980162217

  • 发明设计人 BLAINE D. JOHS;CRAIG M. HERZINGER;

    申请日1998-09-29

  • 分类号G01N21/21;

  • 国家 US

  • 入库时间 2022-08-22 01:37:40

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