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Absolute standard reference materials for low-level concentration measurements

机译:用于低浓度测量的绝对标准参考物质

摘要

A concentration measurement device is calibrated for a target element by performing a concentration measurement on a reference standard sample which includes a number of atoms of a radioactive marker element in known ratio to a number of atoms of the target element. Both the ratio of atoms of the target element to those of the radioactive marker element and a count of decay products of the radioactive marker element are analytically quantified. Because the count of decay products is correlated with the number of atoms of the radioactive marker element, the ratio and the count of decay products are used to accurately calculate the otherwise unknown number of impurity atoms and to calibrate a concentration measurement signal from the concentration measurement device.
机译:通过对参考标准样品执行浓度测量来针对目标元素校准浓度测量设备,该参考标准样品包括放射性标记元素的原子数与目标元素的原子数的已知比率。目标元素与放射性标记元素的原子之比和放射性标记元素的衰变产物的数量均通过分析定量。因为衰变产物的数量与放射性标记元素的原子数相关,所以衰变产物的比率和数量可用于精确计算原本未知的杂质原子数,并从浓度测量中校准浓度测量信号设备。

著录项

  • 公开/公告号US6043486A

    专利类型

  • 公开/公告日2000-03-28

    原文格式PDF

  • 申请/专利权人 ADVANCED MICRO DEVICES INC.;

    申请/专利号US19990225396

  • 发明设计人 TIM Z. HOSSAIN;

    申请日1999-01-05

  • 分类号G01N33/00;

  • 国家 US

  • 入库时间 2022-08-22 01:37:29

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