首页> 外国专利> Defect inspection method by infrared thermography

Defect inspection method by infrared thermography

机译:红外热像仪的缺陷检查方法

摘要

PROBLEM TO BE SOLVED: To provide a method for inspecting defects by an infrared thermography which uses a quick drying paint of a high emissivity to infrared rays and a superior detection accuracy, and easy to remove. SOLUTION: The defect inspection method uses an infrared thermography for obtaining by an infrared camera 12 a thermal image of an object 2 to be inspected to which a temperature field is provided. A paint containing a carbon- based black pigment, a solvent including alcohols and an aliphatic hydrocarbon, and a dispersant is applied to a surface of the object 2. The thermal image is obtained through the applied film 3.
机译:解决的问题:提供一种通过红外热像仪检查缺陷的方法,该方法使用对红外线具有高发射率和优异的检测精度且易于清除的快干涂料。解决方案:缺陷检查方法使用红外热像仪,通过红外热像仪12获得要提供温度场的待检查对象2的热图像。将包含碳基黑色颜料,包括醇和脂族烃的溶剂以及分散剂的涂料施加到物体2的表面。通过施加的膜3获得热图像。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号