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METHOD FOR MEASURING SPECTRAL INTENSITY DISTRIBUTION AND DEVICE FOR MEASURING SPECTRAL INTENSITY DISTRIBUTION

机译:光谱强度分布的测定方法及光谱强度分布的测定装置

摘要

PROBLEM TO BE SOLVED: To measure the spectral intensity distribution of light irradiating a surface to be measured without using any expensive measuring instrument.;SOLUTION: This device is constituted with n (n is a natural number) light passage parts 14 having n kinds of known optical characteristic coefficients, respectively, and irradiated with light, s (s is a natural number) optical sensors 11 having s kinds of known spectral sensitivities, respectively, and detecting photoreceptive intensities of light passed through the passage parts 14, and a calculation part 13 for calculating m (m is a natural number) spectral intensities, as the spectral intensity distribution of the light, with respect to m kinds of wavelengths based on a linear relational equation holding between spectral intensity distribut ion of light and n×s photoreceptive intensities obtained by using the characteristic coefficients, the spectral sensitivities, and the s sensors 11.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:在不使用任何昂贵的测量仪器的情况下测量照射在被测表面上的光的光谱强度分布。解决方案:该设备由n个(n为自然数)光通过部件14构成,该部件具有n种分别具有已知的光谱灵敏度的s(s是自然数)个s(s是自然数)的光并通过光照射的光传感器11和检测通过通道部分14的光的光接收强度,以及计算部图13是用于根据光的光谱强度分布与n倍的感光度之间的线性关系式,对m种波长计算m(m为自然数)光谱强度的光谱强度分布的图通过使用特征系数,光谱灵敏度和s传感器获得11. 11.版权:(C)2001,JPO

著录项

  • 公开/公告号JP2001255210A

    专利类型

  • 公开/公告日2001-09-21

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP20000067517

  • 申请日2000-03-10

  • 分类号G01J3/52;G01J3/51;

  • 国家 JP

  • 入库时间 2022-08-22 01:33:09

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