首页> 外国专利> PRELIMINARY JUDGING METHOD OF COATING THICKNESS DISTRIBUTION, AND COATING METHOD

PRELIMINARY JUDGING METHOD OF COATING THICKNESS DISTRIBUTION, AND COATING METHOD

机译:涂层厚度分布的初步判断方法和涂层方法

摘要

PROBLEM TO BE SOLVED: To obtain a preliminary judging method and coating method for suppressing the unevenness of coating thickness of a magnetic layer formed on a base film for a floppy (registered trade mark) disk within a manufacturing standard and for reducing the ratio of defective products.;SOLUTION: Since the hardness distribution in the width direction of a base film tends to be similar to the unevenness distribution of coating thickness when the base film is coated with a magnetic paint by a die, the unevenness of thickness of a magnetic layer formed on the base film is estimated by measuring the hardness distribution in the width W direction of the base film in a raw roll state 10. The propriety of magnetic layer formation is judged by comparing the difference of a maximum value and a minimum value among the measured values with a standard value. Thereby, the ratio of the defective products can be reduced by eliminating the base film discriminated as negative.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:获得一种初步的判断方法和涂覆方法,该方法和涂覆方法用于在制造标准内抑制形成在用于软盘(注册商标)盘的基膜上的磁性层的涂覆厚度的不均匀性,并减少不良率。产品:解决方案:由于基膜在宽度方向上的硬度分布趋于类似于当通过模具将磁性膜涂在基膜上时基膜厚度的不均匀分布,因此磁性层的厚度不均匀通过测量在原始辊状态10下基膜在宽度W方向上的硬度分布来估计在基膜上形成的厚度。通过比较磁极层之间的最大值和最小值之差来判断磁性层形成的适当性。测量值与标准值。因此,通过消除被判为负片的底膜,可以减少次品的比率。;版权所有:(C)2001,JPO

著录项

  • 公开/公告号JP2001014660A

    专利类型

  • 公开/公告日2001-01-19

    原文格式PDF

  • 申请/专利权人 SONY CORP;

    申请/专利号JP19990179293

  • 发明设计人 HOSHI TOSHIYUKI;

    申请日1999-06-25

  • 分类号G11B5/84;B05C5/02;B05C11/00;B05D1/26;B05D3/00;

  • 国家 JP

  • 入库时间 2022-08-22 01:31:30

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