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CIRCUIT FOR ENHANCING RELIABILITY OF ION INTRODUCTION SYSTEM

机译:增强离子导入系统可靠性的电路

摘要

PROBLEM TO BE SOLVED: To improve the reliability of a system by providing the system with a circuit for detecting the fault of a crystal oscillator for clocking a microprocessor.;SOLUTION: The crystal oscillator is formed by connecting a rock crystal 100 having a frequency of about 32 kHz to an inverter 102 and square waves of about 32 kHz are inputted to the count input of counters 110 and 112. The counter 110 is clocked by output the RC oscillator 100 of 64 kHz. The counter 112 is clocked by a rock crystal 100 of 32 kHz. The output count of the counter 110 is inputted to a first logic circuit 114, by which the presence or absence of the fault of the rock crystal 100 is decided. The output count of the counter 112 is inputted to a secondary logic circuit 116, by which the presence or absence of the fault of the RC oscillator 104 is decided. Excess making and excessively small making may be prevented and the reliability may be improved.;COPYRIGHT: (C)2001,JPO
机译:要解决的问题:通过为系统提供用于检测时钟的故障的电路来为系统提供时钟,以提高系统的可靠性。解决方案:通过连接频率为1的石英晶体100形成晶体振荡器。大约32kHz到反相器102,大约32kHz的方波输入到计数器110和112的计数输入。通过输出64kHz的RC振荡器100为计数器110计时。计数器112由32kHz的晶体100计时。计数器110的输出计数被输入到第一逻辑电路114,通过该第一逻辑电路114来确定岩石晶体100的故障的存在与否。计数器112的输出计数被输入到次级逻辑电路116,由此确定RC振荡器104的故障的存在与否。可以防止过度制作和过度小的制作,并可以提高可靠性。;版权所有:(C)2001,日本特许厅

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