首页> 外国专利> OPTICAL REFLECTION GRATING, SPECTROPHOTOMETER USING THE SAME AND METHOD OF FINDING OPTICAL REFLECTION GRATING WITH HIGH DIFFRACTION EFFICIENCY

OPTICAL REFLECTION GRATING, SPECTROPHOTOMETER USING THE SAME AND METHOD OF FINDING OPTICAL REFLECTION GRATING WITH HIGH DIFFRACTION EFFICIENCY

机译:光学反射光栅,使用其的分光光度计和高衍射效率的光学反射光栅的寻找方法

摘要

PROBLEM TO BE SOLVED: To provide an optical reflection grating attaining diffraction efficiency of TE(transverse electric) wave and TM(transverse magnetic) wave equal with each other as far as possible and concurrently attaining diffraction efficiency as high as possible, a spectrophotometer using the reflection grating and a method for finding such an optical reflection grating.;SOLUTION: In the optical reflection grating with numerous parallel grooves (5), when a ratio of a grating period (g) to a wavelength is 0.9 or preferably 0.7, the depth of the grooves is set to a depth which realizes the diffraction efficiency DE of the TE and TM waves at a defined wavelength being only 10% or preferably 5% different with each other and respectively being 60%. Thereby the diffraction efficiency DE is practically independent of the polarization direction of incident light and is extremely high.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:为了提供一种光学反射光栅,该光学反射光栅能够使TE(横向)电波和TM(横向电磁)波的衍射效率尽可能地相等,并且同时达到尽可能高的衍射效率,解决方案:在具有许多平行凹槽(5)的光学反射光栅中,当光栅周期(g)与波长的比率<0.9或优选地<0.7时,凹槽的深度被设定为这样的深度,该深度使得TE和TM波在限定的波长处的衍射效率DE彼此之间仅<10%或优选地<5%,并且分别为60%。因此,衍射效率DE实际上与入射光的偏振方向无关,并且非常高。;版权所有:(C)2001,日本特许厅

著录项

  • 公开/公告号JP2001242314A

    专利类型

  • 公开/公告日2001-09-07

    原文格式PDF

  • 申请/专利权人 WAVETEK WANDEL GOLTERMANN ENINGEN GMBH;

    申请/专利号JP20010010314

  • 发明设计人 FUHRMANN THOMAS;

    申请日2001-01-18

  • 分类号G02B5/18;G01J3/18;

  • 国家 JP

  • 入库时间 2022-08-22 01:27:55

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