首页> 外国专利> METHOD FOR CALCULATING LIGHT INTENSITY SLOPE, METHOD FOR CALCULATING LIGHT INTENSITY LOG SLOPE, AND MEDIUM RECORDING PROGRAM DESCRIBING THESE METHODS FOR CALCULATION

METHOD FOR CALCULATING LIGHT INTENSITY SLOPE, METHOD FOR CALCULATING LIGHT INTENSITY LOG SLOPE, AND MEDIUM RECORDING PROGRAM DESCRIBING THESE METHODS FOR CALCULATION

机译:计算光强度斜率的方法,计算光强度对数斜率的方法以及描述这些计算方法的介质记录程序

摘要

PROBLEM TO BE SOLVED: To calculate a light intensity slope at high rate.;SOLUTION: In the method for calculating the light intensity slope of a projection image when light from a photomask is projected to an object through an optical system, a characteristic function ϕ representative of the characteristic of the optical system is calculated and tables Φ, Φx, Φy are formed by integrating the characteristic function ≃, respectively, in a rectangular region, a horizontal band region and a vertical band region. A light intensity slope I' is determined using these tables in conjunction with the data of the photomask.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:以高速率计算光强度斜率;解决方案:在将来自光罩的光通过光学系统投射到物体上时的投影图像的光强度斜率的计算方法中,特征函数&phiv ;计算代表光学系统特性的代表值,并通过分别在矩形区域,水平带区域和垂直带区域中积分特性函数来形成表φ,x,y。使用这些表并结合光掩模的数据确定光强度斜率I'。;版权:(C)2001,JPO

著录项

  • 公开/公告号JP2001155987A

    专利类型

  • 公开/公告日2001-06-08

    原文格式PDF

  • 申请/专利权人 NEC CORP;

    申请/专利号JP19990335789

  • 发明设计人 INUI HIROTOMO;

    申请日1999-11-26

  • 分类号H01L21/027;G03F7/20;

  • 国家 JP

  • 入库时间 2022-08-22 01:27:01

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