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LUMINANCE CHARACTERISTIC MEASUREMENT INSTRUMENT FOR CRT

机译:CRT的亮度特性测量仪器

摘要

PROBLEM TO BE SOLVED: To measure the luminance characteristic of a CRT with high accuracy at a high speed.;SOLUTION: A data fetch control section 2 of this luminance characteristic measurement instrument changes the raster size to display a test pattern, consisting of a plurality of longitudinal or lateral stripes generated by a signal generator 4 onto a color CRT 6, in a way such that relative positions of phosphors in each stripe differs from each other. The image of this test pattern is picked up by a CCD camera 3 and the data fetch control section 2 fetches the picked-up image. The emission position and the luminance level of each stripe of the emission phosphor are calculated from the picked-up image and the luminance distribution of the test pattern in units of stripes (luminescent-non- luminescent-luminescent parts) is calculated by rearranging the luminance levels, based on the light emission position and a display device 52 displays the result of calculation.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:高速,高精度地测量CRT的亮度特性。解决方案:该亮度特性测量仪器的数据获取控制部分2改变光栅尺寸以显示测试图案,该图案由多个信号发生器4产生的纵向或横向条纹在彩色CRT 6上的排列方式,使得每个条纹中荧光粉的相对位置彼此不同。该测试图案的图像由CCD照相机3拾取,并且数据获取控制部2获取所拾取的图像。根据所拍摄的图像计算出发光荧光体的每个条带的发光位置和亮度水平,并且通过重新布置亮度来计算以条带为单位的测试图案的亮度分布(不发光的发光部分)。等级,基于发光位置并且显示装置52显示计算结果。版权所有:(C)2001,JPO

著录项

  • 公开/公告号JP2001008240A

    专利类型

  • 公开/公告日2001-01-12

    原文格式PDF

  • 申请/专利权人 MINOLTA CO LTD;

    申请/专利号JP19990178431

  • 发明设计人 NISHIKAWA NOBUHIRO;

    申请日1999-06-24

  • 分类号H04N17/04;H01J9/42;

  • 国家 JP

  • 入库时间 2022-08-22 01:26:45

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