首页> 外国专利> Method for obtaining Enhanced images in x-ray Beam, Beam apparatus for use in x-ray Plane detector to detect gaseous Avalanche and incident Radiation

Method for obtaining Enhanced images in x-ray Beam, Beam apparatus for use in x-ray Plane detector to detect gaseous Avalanche and incident Radiation

机译:在x射线束中获得增强图像的方法,用于x射线平面检测器中以检测气态雪崩和入射辐射的束装置

摘要

A method and apparatus for x-ray Radiography, and especially for Flat Beam and a detector for Detecting Radiation incident.In the method and apparatus, (9) where x-rays are emitted from an x-ray Source (60),To room x shaped Flat Beam and are transmitted through an object to be x-rayed (62)And the x-rays transmitted through the object (62) are detected in a detector (64).The detector (64), the cualdetecta incident Radiation, is a parallel Plate Avalanche Chamber gas,Including Assemblies of electrode between which a Voltage is applied for creating an electrical fieldWhich cause Avalanches of electrons released by Primary and Secondary Ionization laradiacio n incident.The detector (64) is oriented in relation to the incident Radiation (9), so that the Radiation enters Sideways between a First and a Second Parallel Plate,Among which the electrical field is created.The senaleselu00e9ctricas Indu down by these electron ion Avalanches are detected by at least one mounting deelectrodo detectorIncluding a Plurality of electrode detector Elements arranged adjacent to each other, each along unadireccion ncialmente than that parallel to the incident Radiation.The pulses from each detector electrode Element are processed in processing Electronics,For pixel values corresponding to the respective Element deelectrodo detector
机译:一种用于X射线射线照相的方法和设备,尤其是用于平面光束的射线照相方法和用于检测辐射入射的检测器。在该方法和设备中,(9)从X射线源(60)发射X射线到房间X形的扁平光束通过物体(X)进行透射(62),并通过物体(62)透射的X射线在检测器(64)中进行检测。检测器(64)是cualdetecta入射辐射,是平行板雪崩室气体,包括电极组件,在其之间施加电压以产生电场,这是由一次和二次电离辐射半径入射的电子雪崩引起的。探测器(64)的取向与入射辐射有关(9),使得辐射在第一和第二平行平板之间横向进入,并在其中产生电场。这些电子离子雪崩引起的senalesel u00e9ctricas Indu至少由一个安装的去电极电子探测器检测到r包括多个彼此相邻布置的电极检测器元件,每个电极检测器沿平行于入射辐射的方向平行排列。来自每个检测器电极元件的脉冲在处理电子设备中进行处理,以获取对应于各个Element deelectrodo检测器的像素值

著录项

  • 公开/公告号AR015981A1

    专利类型

  • 公开/公告日2001-05-30

    原文格式PDF

  • 申请/专利权人 XCOUNTER AB;

    申请/专利号AR1998P105314

  • 发明设计人

    申请日1998-10-23

  • 分类号H05G1/64;

  • 国家 AR

  • 入库时间 2022-08-22 01:26:19

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号