Automated System for the characterization metrolu00d3gica Digitally Controlled Analogue ELECTRONICS DEVICES

摘要

Automated System for Metrological characterisation of Digitally Controlled Analog Electronic Devices,Allows the simultaneous Measurement of the strain in the inputs and outputs of the device under test.Automating the change of the Code in the digital inputs of the device under test to modify its internal Configuration.The system can reconfigure the programming and the characteristics of the Block used in Analog / digital conversion to meet the characteristics of the device under test withoutNeed to connect new blocks in the system.