首页> 外国专利> METHOD OF MAPPING SURFACES IN AN OPTICAL ULTRARESOLVING SCANNING MICROSCOPE AND OPTICAL ULTRARESOLVING SCANNING MICROSCOPE AS SUCH

METHOD OF MAPPING SURFACES IN AN OPTICAL ULTRARESOLVING SCANNING MICROSCOPE AND OPTICAL ULTRARESOLVING SCANNING MICROSCOPE AS SUCH

机译:光学超分辨扫描显微镜中的表面映射方法及光学超分辨扫描显微镜中的映射方法

摘要

1. The method of surface mapping in a super-resolving scanning optical microscope consists in the following: A laser light beam is divided into two beams: the object beam and the reference beam. The object beam is focused and the examined object is scanned. The reflected object beam of light is subjected to interference with the reference beam. The obtained interference pattern is enlarged, subjected to detection and analysed. It is characterised in that optical vortices with known characteristics are produced in the object beam of laser light. The beam is then divided into two beams. The object beam is focused and the examined object is scanned. The reflected object beam of light is subjected to interference with the reference beam. The obtained interference pattern is enlarged, subjected to detection and analysed. Changes in the location and geometry of optical vortices in the reflected object beam are determined and the topography of the examined object is mapped.
机译:1.在超分辨扫描光学显微镜中进行表面映射的方法如下:激光光束分为两束:物镜光束和参考光束。聚焦物体光束并扫描检查的物体。反射的目标光束会受到参考光束的干扰。放大所获得的干涉图样,进行检测和分析。其特征在于,在激光的目标光束中产生具有已知特性的光学涡旋。然后将光束分为两束。聚焦物体光束并扫描检查的物体。反射的目标光束会受到参考光束的干扰。放大所获得的干涉图样,进行检测和分析。确定反射物体光束中光学涡旋的位置和几何形状的变化,并绘制检查物体的形貌。

著录项

  • 公开/公告号PL336545A1

    专利类型

  • 公开/公告日2001-05-21

    原文格式PDF

  • 申请/专利权人 POLITECHNIKA WROCLAWSKA;

    申请/专利号PL19990336545

  • 发明设计人 MASAJADA JAN;

    申请日1999-11-10

  • 分类号G02B21/00;G02B26/10;

  • 国家 PL

  • 入库时间 2022-08-22 01:24:10

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