Large Scale Integration test device has I/O connections corresponding to the number of connecting pins on the LSI and a control circuits corresponding to the I/O connections

摘要

The LSI test device has a number of I/O connections corresp. to the number of connecting pins on the LSI and a number of control circuits corresp. to the I/O connections. Each control circuit has a waveform and time signal generating circuit for generating an output signal when receiving a reference signal, a time offset circuit for setting the time characteristics of the output signal, a feedback path and a state detection unit. An Independent claim is also included for a calibration method for use with an LSI test arrangement.