Determining refraction index, involves using characteristic curve of functional relationship between intensity distribution and refractive index

摘要

The method involves detecting orders of diffraction to form at least one intensity ratio, producing at least one intensity distribution by subjecting a scattering arrangement to a light beam, forming intensity ratio(s) using the orders of diffraction, determining at least one section of a curve of the relationship between intensity distribution and refractive index and associating the intensity distribution produced with the refractive index. The method involves providing a quantity of material in the form of a theoretically detectable diffraction and/or scattering arrangement, detecting two or more orders of diffraction to form at least one intensity ratio, producing at least one intensity distribution by subjecting the scattering arrangement to a light beam of defined form, forming the intensity ratio(s) using the orders of diffraction of the intensity distribution, determining at least one section of a characteristic curve of the functional relationship between the intensity distribution and the refractive index and associating the intensity distribution produced with the refractive index using the curve. Independent claims are also included for the following: a device for determining a refraction index.