首页> 外国专利> Read amplifier circuit for semiconductor memory has shunt resistor connected to reference cell to receive signals from differential amplifier connected in common to shunt resistor and reference cell

Read amplifier circuit for semiconductor memory has shunt resistor connected to reference cell to receive signals from differential amplifier connected in common to shunt resistor and reference cell

机译:用于半导体存储器的读放大器电路的分流电阻器连接到参考单元,以从差分放大器接收信号,该差分放大器共同连接到分流电阻器和参考单元

摘要

A shunt resistor (116) is connected to a reference cell (108) to receive signals from a differential amplifier (118) which is connected in common to the shunt resistor and the reference cell by a data line (DL) and a reference line (RDL) in accordance with the logic status of a memory location (102), and to output either a high level voltage or a low level voltage to the base of the reference line. The memory location has either a first threshold voltage or a second threshold voltage. The reference cell has a third threshold voltage between the first threshold voltage and the second threshold voltage. A first load transistor (106) is connected between a supply voltage and the data line connected to the memory location. A second load transistor (112) is connected between the supply voltage and the reference line connected to the reference cell.
机译:分流电阻器(116)连接到参考单元(108),以接收来自差分放大器(118)的信号,该差分放大器通过数据线(DL)和参考线(DL)共同连接到分流电阻器和参考单元。 RDL)根据存储位置(102)的逻辑状态,并向参考线的基极输出高电平电压或低电平电压。存储器位置具有第一阈值电压或第二阈值电压。参考单元具有在第一阈值电压和第二阈值电压之间的第三阈值电压。第一负载晶体管(106)连接在电源电压和连接到存储器位置的数据线之间。第二负载晶体管(112)连接在电源电压和连接到参考单元的参考线之间。

著录项

  • 公开/公告号DE10034230A1

    专利类型

  • 公开/公告日2001-04-12

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号DE2000134230

  • 发明设计人 CHO SUNG-HEE;

    申请日2000-07-14

  • 分类号G11C7/06;G11C16/26;

  • 国家 DE

  • 入库时间 2022-08-22 01:09:45

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