首页> 外国专利> Self-testing integrated circuit has switch which selectively provides either output signal of test access port or output signal of command decoder to shift register

Self-testing integrated circuit has switch which selectively provides either output signal of test access port or output signal of command decoder to shift register

机译:自测试集成电路具有开关,该开关选择性地将测试访问端口的输出信号或命令解码器的输出信号提供给移位寄存器

摘要

A command decoder (60) stores system command data received through input port, in control register (61) and outputs command data through output port (80). A switch (50) selectively provides either output signal of test access port (TAP) (20) or output signal of decoder into shift register (30). The shift register shifts the received data and outputs shifted data. An Independent claim is also included for method for evaluating integrated circuit in system environment.
机译:命令解码器(60)将通过输入端口接收的系统命令数据存储在控制寄存器(61)中,并通过输出端口(80)输出命令数据。开关(50)选择性地将测试访问端口(TAP)(20)的输出信号或解码器的输出信号提供给移位寄存器(30)。移位寄存器对接收到的数据进行移位并输出移位后的数据。还包括关于在系统环境中评估集成电路的方法的独立权利要求。

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