首页> 外国专利> Plasma emission spectroscopy analysis includes formation of solution with sample, and gassing solution to create plasma for analysis

Plasma emission spectroscopy analysis includes formation of solution with sample, and gassing solution to create plasma for analysis

机译:等离子体发射光谱分析包括与样品形成溶液,以及将溶液放气以产生用于分析的等离子体

摘要

the system includes formation of a solution containing the sample, and conversion into gas for analysis within a plasma chamber. The analysis method includes dissolving the sample in a bath containing an etching reagent, and then heating the resulting solution. This leads to a gaseous discharge which is then fed into a plasma in order to measure the intensity of the emission lines. The apparatus includes an inert gas source, a plasma torch and a spectrometer which is connected to a measuring system. A container (B) is equipped with an inlet from the inert gas source (Ar) and a system (E) for introducing a sample, and an inlet for the etching solution (SE). This container has an outlet connected to the plasma torch for analysis.
机译:该系统包括形成包含样品的溶液,并转化成气体以在等离子体室内进行分析。分析方法包括将样品溶解在含有蚀刻剂的浴中,然后加热所得溶液。这导致气体放电,然后将其馈入等离子体中以测量发射线的强度。该设备包括惰性气体源,等离子炬和连接到测量系统的光谱仪。容器(B)配备有来自惰性气体源(Ar)的入口和用于引入样品的系统(E),以及用于蚀刻溶液(SE)的入口。该容器的出口连接到等离子炬进行分析。

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