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Methods and devices for achieving alignment of a beam-propagation axis with a center of an aperture in a charged-particle-beam optical system

机译:在带电粒子束光学系统中实现光束传播轴与孔径中心对准的方法和装置

摘要

Methods and devices are disclosed for aligning a beam-propagation axis with the center of an aperture, especially an aperture configured to limit the aperture angle of the charged particle beam. In an exemplary method, an alignment-measurement aperture is provided at an imaging plane of a charged-particle-beam (CPB) optical system, and a beam detector is downstream of the alignment-measurement aperture. A scanning deflector is energized to cause the beam to be scanned in two dimensions, transverse to an optical axis, over the aperture. Meanwhile, the beam detector obtains an image of beam intensity in the two dimensions. In the image a maximum-intensity point is identified, corresponding to the propagation axis. Based on the two-dimensional image, the beam is deflected as required to align the propagation axis with the aperture center.
机译:公开了用于使束传播轴与孔的中心对准的方法和装置,所述孔特别是被配置为限制带电粒子束的孔角度的孔。在示例性方法中,在带电粒子束(CPB)光学系统的成像平面处设置对准测量孔,并且光束检测器在对准测量孔的下游。扫描偏转器被激励以使光束在孔径上横向于光轴以二维方向被扫描。同时,光束检测器获得二维光束强度的图像。在图像中,确定了一个与传播轴相对应的最大强度点。基于二维图像,根据需要偏转光束,以使传播轴与孔径中心对齐。

著录项

  • 公开/公告号US2001010362A1

    专利类型

  • 公开/公告日2001-08-02

    原文格式PDF

  • 申请/专利权人 NIKON CORPORATION;

    申请/专利号US20010765530

  • 发明设计人 HIROYASU SIMIZU;

    申请日2001-01-19

  • 分类号G21K1/08;H01J3/14;H01J3/26;H01J49/42;

  • 国家 US

  • 入库时间 2022-08-22 01:07:18

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