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Method of manufacturing cathode for plasma etching apparatus using chemical surface treatment with potassium hydroxide (KOH), and cathode manufactured thereby

机译:使用氢氧化钾(KOH)进行化学表面处理的等离子体蚀刻装置用阴极的制造方法以及由此制造的阴极

摘要

A method of manufacturing a cathode for a plasma etching apparatus includes steps for making the inside of holes formed in the cathode and the surface of the cathode a hard surface so as to prevent particle generation while the cathode is in use for etching a wafer. These steps include: a) forming a plurality of holes in a silicon substrate; b) carrying out a physical-surface treatment on the surface of the silicon substrate using slurry; and c) carrying out a chemical- surface treatment for removing protrusions inside the holes formed on the silicon substrate and on the surface of the silicon substrate using potassium hydroxide (KOH). The cathode manufactured by this method has a hard surface formed thereon and inside the holes, and the hard surface has no protrusions. Without protrusions, no particles can be generated from protrusions being etched and loosened during the etching process, so no particles adhere to the wafer being etched.
机译:制造用于等离子体蚀刻设备的阴极的方法包括以下步骤:使在阴极中形成的孔的内部和阴极的表面为硬表面,以防止在阴极用于蚀刻晶片时产生颗粒。这些步骤包括:a)在硅衬底上形成多个孔; b)使用浆料在硅衬底的表面上进行物理表面处理; c)进行化学表面处理,以使用氢氧化钾(KOH)去除在硅衬底上形成的孔内和硅衬底表面上的突起。通过该方法制造的阴极在其上和孔的内部具有硬质表面,并且该硬质表面没有突起。如果没有突起,则在蚀刻过程中不会因突起而产生颗粒并使其松弛,因此不会有颗粒粘附到被蚀刻的晶圆上。

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