首页> 外国专利> Method for fabricating a nonvolatile memory including implanting the source region, forming the first spacers, implanting the drain regions, forming the second spacers, and forming a source line on the source and second spacers

Method for fabricating a nonvolatile memory including implanting the source region, forming the first spacers, implanting the drain regions, forming the second spacers, and forming a source line on the source and second spacers

机译:制造非易失性存储器的方法包括:注入源极区,形成第一间隔物,注入漏极区,形成第二间隔物以及在源极和第二间隔物上形成源极线

摘要

A method for fabricating in a non-volatile memory is provided. The method includes providing a substrate having a memory region. A stacked gate structure is formed on the substrate at the memory region. A source region is formed abutting the stacked gate structure, and an isolation structure is formed to isolate the source region, in which a drain region is also formed abutting the stacked gate structure on the opposite side but not actually related to the invention. A first spacer is formed on each sidewall of the stacked gate structure. A conductive layer is form over the substrate and is patterned to remove a portion of a conductive layer. A remaining portion of the conductive layer covers the isolation structure and the source region so as to form a source line, which has an electrical coupling to each source region belong to a same word line. The stacked gate structure is therefore exposed.
机译:提供了一种用于制造非易失性存储器的方法。该方法包括提供具有存储区域的衬底。在衬底上的存储区处形成堆叠的栅极结构。形成邻接堆叠栅极结构的源极区域,并且形成隔离结构以隔离源极区域,其中也形成了在相对侧邻接堆叠栅极结构但实际上与本发明无关的漏极区域。第一间隔物形成在堆叠的栅极结构的每个侧壁上。导电层形成在衬底上方并且被图案化以去除导电层的一部分。导电层的其余部分覆盖隔离结构和源极区域,从而形成源极线,该源极线与属于同一字线的每个源极区域具有电耦合。因此,堆叠的栅极结构被暴露。

著录项

  • 公开/公告号US6238977B1

    专利类型

  • 公开/公告日2001-05-29

    原文格式PDF

  • 申请/专利权人 UNITED INTEGRATED CIRCUITS CORP;

    申请/专利号US19990282015

  • 发明设计人 KUO-TUNG SUNG;

    申请日1999-03-29

  • 分类号H01L213/36;

  • 国家 US

  • 入库时间 2022-08-22 01:04:11

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