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Target acquisition system and radon transform based method for target azimuth aspect estimation

机译:基于目标采集系统和基于ra变换的目标方位角估计方法

摘要

A Radon transform based method that provides for target azimuth aspect estimation and target shape measurement. A Radon transform is applied to a binary (N×N pixels) target chip to extract target features that are then used to measure length, width, and diagonal features of the target. In parallel, these features are used to estimate the azimuth aspect angle, or size, of the target. The method is effective in discriminating targets from clutter. The method is also very time efficient and highly flexible in its operation because the features can automatically account for any target rotation or shift. The present invention also provides for a target acquisition system that employs the Radon transform based method for target azimuth aspect estimation.
机译:基于Radon变换的方法,可提供目标方位角方面的估计和目标形状的测量。将Radon变换应用于二进制(N×N像素)目标芯片以提取目标特征,然后将其用于测量目标的长度,宽度和对角线特征。并行地,这些特征被用于估计目标的方位角方位角或大小。该方法有效地将目标与混乱区分开。该方法还非常省时且操作灵活,因为这些功能可以自动考虑任何目标旋转或移动。本发明还提供一种目标采集系统,该系统采用基于Radon变换的方法进行目标方位角方面的估计。

著录项

  • 公开/公告号US6259396B1

    专利类型

  • 公开/公告日2001-07-10

    原文格式PDF

  • 申请/专利权人 RAYTHEON COMPANY;

    申请/专利号US19990384078

  • 发明设计人 QUOC H. PHAM;ALBERT EZEKIEL;

    申请日1999-08-26

  • 分类号G01S130/00;G01S138/90;G01S139/00;

  • 国家 US

  • 入库时间 2022-08-22 01:03:51

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