METHOD FOR GENERATING TEST SET FOR SCANNING METHOD 3 WEIGHT RANDOM BUILT-IN SELF-TEST AND SCANNING METHOD BUILT-IN SELF-TEST CIRCUIT

摘要

PROBLEM TO BE SOLVED: To reduce a test sequence length and a hardware overhead in a 3 weight WRPT BIST (test-per-clock and scanning method).;SOLUTION: This method is used to generate a test set for difficult-to-detect failure, and a difficult-to-detect failure set is identified and the test set is generated by using an improved type automatic test pattern generator. The improved type automatic test pattern generator is applied so as to taking into consideration a hardware overhead and test sequence length, and the hardware overhead is generated when a new test cube is added to the test set.;COPYRIGHT: (C)2002,JPO