首页> 外国专利> LASER SCATTERING METHOD AND EQUIPMENT FOR MEASURING SURFACE TENSION/INTERFACE TENSION

LASER SCATTERING METHOD AND EQUIPMENT FOR MEASURING SURFACE TENSION/INTERFACE TENSION

机译:用于测量表面张力/界面张力的激光散射方法和设备

摘要

PROBLEM TO BE SOLVED: To provide a convenient and highly reliable laser scattering method and equipment for measuring surface tension/interface tension.;SOLUTION: In the laser scattering method for scattering laser light impinging on the surface 2 or the interface of liquid by a wave generated thereon, determining the frequency of the wave through the interference of scattering light and reference light and calculating surface tension or interface tension, the laser light is not split to have a plurality of optical axes but a part of light in a beam spreading on a single optical axis is used for generating the signal light and the remaining light is used partially or entirely as the reference light being detected by a photodetector 3.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:提供一种方便且高度可靠的激光散射方法和设备,用于测量表面张力/界面张力。;解决方案:在激光散射方法中,通过波散射撞击在表面2或液体界面上的激光产生的光,通过散射光和参考光的干涉来确定波的频率,并计算表面张力或界面张力,激光不会被分裂为具有多个光轴,而是一部分光束会散布在光轴上。单个光轴用于生成信号光,其余光部分或全部用作光电探测器3所检测到的参考光。版权所有:(C)2002,JPO

著录项

  • 公开/公告号JP2002090281A

    专利类型

  • 公开/公告日2002-03-27

    原文格式PDF

  • 申请/专利权人 JAPAN SCIENCE & TECHNOLOGY CORP;

    申请/专利号JP20000278975

  • 发明设计人 TSUYUMOTO ISAO;UCHIKAWA HIROSHI;

    申请日2000-09-14

  • 分类号G01N13/02;

  • 国家 JP

  • 入库时间 2022-08-22 00:55:44

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