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SLIT MEMBER AND SLIT ASSEMBLY

机译:分会会员和分会会员

摘要

PROBLEM TO BE SOLVED: To provide a slit member, having sufficiently high flatness and capable of suppressing the influence of outgoing light from a light outgoing point other than a light outgoing point, to be a measuring target to a measured result of a light quantity measuring instrument, while fully accurately positioning the light outgoing member with respect to a slit member, capable of restricting an optical path rushing into the light quantity measuring instrument by arranging the slit member between a light outgoing point and the light quantity measuring instrument.;SOLUTION: The slit member 34 is constituted of a metal base material and a metallic film member 34a, formed on the surface of the base material by electrolytic plating, and the film member 34a is constituted of a metal whose reflection index is lower than that of a metal constituting the base material.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:提供一种狭缝构件,其具有足够高的平坦度并且能够抑制来自除光出射点之外的光出射点的出射光的影响,作为对光量测量的测量结果的测量目标。通过将狭缝部件布置在出光点和光通量测量仪之间,可以相对于狭缝部件精确地定位光出射部件,同时可以限制进入光通量测量仪的光路。狭缝部件34由金属基材和通过电镀形成在基材表面上的金属膜部件34a构成,膜部件34a由反射率比金属低的金属构成。构成基材。;版权所有:(C)2002,日本特许厅

著录项

  • 公开/公告号JP2002090893A

    专利类型

  • 公开/公告日2002-03-27

    原文格式PDF

  • 申请/专利权人 NORITSU KOKI CO LTD;

    申请/专利号JP20000281815

  • 发明设计人 IRAHARA DAISUKE;

    申请日2000-09-18

  • 分类号G03B27/32;B41J2/445;G01J1/06;G03B27/54;

  • 国家 JP

  • 入库时间 2022-08-22 00:55:34

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