首页> 外国专利> SUNLIGHT EVALUATION METHOD AND DEVICE

SUNLIGHT EVALUATION METHOD AND DEVICE

机译:阳光评价方法及装置

摘要

PROBLEM TO BE SOLVED: To provide a new sunlight evaluation method and device for easily evaluating and grasping the shade and reflection light at an arbitrary point.;SOLUTION: An evaluation image region to be evaluated is cut (s2) from a hemispherical image (s1) photographed at an evaluation point, a solar trace according to the latitude, longitude, azimuth angle, and oblique angle of the evaluation point is acquired (s3), the overlapped image of the solar trace and the evaluation image region is created (s4), and the shade of the solar trace is evaluated (s5) by an object around the evaluation point being present within the valuation image region.;COPYRIGHT: (C)2002,JPO
机译:要解决的问题:提供一种新的阳光评估方法和装置,可轻松评估和掌握任意点处的阴影和反射光。解决方案:从半球图像(s1)切割要评估的评估图像区域(s2) )在评估点拍摄的照片,根据评估点的纬度,经度,方位角和倾斜角获取太阳轨迹(s3),创建太阳轨迹和评估图像区域的重叠图像(s4) ,并且通过评估图像区域内存在的评估点周围的物体评估(s5)太阳轨迹的阴影。COPYRIGHT:(C)2002,JPO

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号