首页> 外国专利> TEST DATA GENERATION SYSTEM, TEST SYSTEM, TEST DATA GENERATING METHOD, COMPUTER-READABLE RECORDING MEDIUM WITH RECORDED TEST DATA GENERATING PROGRAM, AND TEST DATA GENERATING PROGRAM

TEST DATA GENERATION SYSTEM, TEST SYSTEM, TEST DATA GENERATING METHOD, COMPUTER-READABLE RECORDING MEDIUM WITH RECORDED TEST DATA GENERATING PROGRAM, AND TEST DATA GENERATING PROGRAM

机译:测试数据生成系统,测试系统,测试数据生成方法,具有记录的测试数据生成程序的计算机可读记录介质以及测试数据生成程序

摘要

PROBLEM TO BE SOLVED: To provide such test data that data sent on a data bus are switched at one time.;SOLUTION: A test data generation system which generates the test data for testing hardware connected to the data bus is equipped with a device information storage part 60 which previously stores device information related to the hardware to be tested, an analysis part 20 which inputs test information specifying the hardware to be tested and obtains the bus width of the data bus where the hardware is connected according to the inputted test information and the device information stored in the device information storage part, a test data generation part 30 which generates such test data that data sent on the data bus are switched at one time, and a test data storage part 70 which stores the test data generated by the test data generation part 30.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:要提供这样的测试数据,即一次交换在数据总线上发送的数据。;解决方案:一种测试数据生成系统,该系统生成用于测试连接到数据总线的硬件的测试数据,并具有设备信息。预先存储与要测试的硬件有关的设备信息的存储部分60,分析部分20,分析部分20输入指定要测试的硬件的测试信息,并根据输入的测试信息获得连接硬件的数据总线的总线宽度以及存储在设备信息存储部分中的设备信息,测试数据生成部分30,生成一次交换在数据总线上发送的数据的测试数据;测试数据存储部分70,存储通过测试数据生成部分30 。;版权:(C)2002,JPO

著录项

  • 公开/公告号JP2002222095A

    专利类型

  • 公开/公告日2002-08-09

    原文格式PDF

  • 申请/专利权人 MITSUBISHI ELECTRIC CORP;

    申请/专利号JP20010017441

  • 发明设计人 YASUOKA NOBUAKI;

    申请日2001-01-25

  • 分类号G06F11/22;G01R31/3183;G01R31/28;

  • 国家 JP

  • 入库时间 2022-08-22 00:54:20

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