TEST MODEL GENERATION APPARATUS AND TEST MODEL GENERATION METHOD

摘要

PROBLEM TO BE SOLVED: To provide an apparatus that can generate a test model corresponding to test condition by a simple operation and can increase the circuit design efficiency.;SOLUTION: The apparatus generates a test model that conducts circuit tests on the basis of circuit descriptions and the test conditions when the circuit descriptions for the test described by a hardware describing language and the test conditions are specified.;COPYRIGHT: (C)2002,JPO