首页>
外国专利>
Method for determining an operational condition of a thermal field electron emitter, a method for operating the thermal field electron emitter and an electron beam utilizing system having the thermal field electron emitter
Method for determining an operational condition of a thermal field electron emitter, a method for operating the thermal field electron emitter and an electron beam utilizing system having the thermal field electron emitter
An S/N ratio of a probe current is measured while a filament current is changed, and the filament current in which the S/N ratio is maximal is determined.
展开▼