首页> 外国专利> SPUTTERING METHOD TO GENERATE IONIZED METAL PLASMA USING ELECTRON BEAMS AND MAGNETIC FIELD

SPUTTERING METHOD TO GENERATE IONIZED METAL PLASMA USING ELECTRON BEAMS AND MAGNETIC FIELD

机译:电子束和磁场产生电离金属等离子体的溅射方法

摘要

A deposition system in a semiconductor fabrication system provides at least one electron gun which injects energetic electrons into a semiconductor fabrication chamber to initiate and sustain a relatively high density plasma at extremely low pressures. In addition to ionizing atoms of the extremely low pressure gas, such as an argon gas at 100 microTorr, for example, the energetic electrons are also believed to collide with target material atoms sputtered from a target positioned above a substrate, thereby ionizing the target material atoms and losing energy as a result of the collisions. Preferably, the electrons are injected substantially tangentially to the walls of a chamber shield surrounding the plasma in a magnetic field generally parallel to a central axis of the semiconductor fabrication chamber connecting the target to and the substrate. As the injected electrons lose energy ionizing the target material atoms, the electrons spiral inward toward a central region of the semiconductor fabrication chamber surrounding the central axis, forming an electron cloud in the central region. An arrangement of electromagnets may be positioned adjacent the walls of the chamber shield surrounding the plasma to generate the magnetic field. It is believed that the configuration of magnetic fields also keeps electrons from colliding with the walls of the chamber shield surrounding the plasma.
机译:半导体制造系统中的沉积系统提供至少一个电子枪,该电子枪将高能电子注入到半导体制造室中,以在极低的压力下引发并维持相对高密度的等离子体。例如,除了将极低压气体(例如100微托的氩气)中的原子电离外,高能电子还被认为与从位于衬底上方的靶溅射出的靶材料原子发生碰撞,从而使靶材料电离。原子由于碰撞而损失能量。优选地,在大体上平行于将靶材与衬底连接的半导体制造室的中心轴的磁场中,将电子基本上切向地注入到围绕等离子体的室屏蔽的壁上。随着注入的电子失去使目标材料原子电离的能量,电子朝着围绕中心轴的半导体制造腔室的中心区域向内螺旋运动,从而在中心区域形成电子云。可以将电磁体的布置定位成邻近围绕等离子体的腔室屏蔽的壁,以产生磁场。据认为,磁场的配置还防止电子与围绕等离子体的室屏蔽的壁碰撞。

著录项

  • 公开/公告号US2002005348A1

    专利类型

  • 公开/公告日2002-01-17

    原文格式PDF

  • 申请/专利权人 XU ZHENG;RAMASWAMI SESHADRI;

    申请/专利号US19970812657

  • 发明设计人 ZHENG XU;SESHADRI RAMASWAMI;

    申请日1997-03-07

  • 分类号C23C14/32;C23C14/32;

  • 国家 US

  • 入库时间 2022-08-22 00:50:42

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