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Method of analyzing spectrum using multi-slit member and multi-channel spectrograph using the same

机译:使用多狭缝成员分析频谱的方法和使用该方法的多通道光谱仪

摘要

Disclosed herein is a method of analyzing spectrum using multi-slit member and multi-channel spectrograph using the method. The multi-channel spectrograph includes a focusing lens (12a) for focusing the focus of an objective light (2) generated in a light source (4) and passed through a specimen (3). A slit unit passes the objective light focused by the focusing lens (12a) through at least one slit formed therein. A concave grating (16) diffracts the objective light (2) passed through the slit unit. A detector unit detects the objective light diffracted by the concave grating (16). The slit unit is a multi-slit member (14) with a plurality of slits (14a). The objective light (2) diffracted by the concave grating (16) and directed toward the detector unit is moved by the movement of the multi-slit member (14).
机译:本文公开了一种使用多狭缝构件分析光谱的方法以及使用该方法的多通道光谱仪。多通道光谱仪包括聚焦透镜(12a),用于聚焦在光源(4)中产生并穿过样本(3)的物镜(2)的焦点。狭缝单元使由聚焦透镜(12a)聚焦的物光穿过形成在其中的至少一个狭缝。凹面光栅(16)对穿过狭缝单元的物镜光(2)进行衍射。检测器单元检测由凹面光栅(16)衍射的物镜光。狭缝单元是具有多个狭缝(14a)的多狭缝构件(14)。通过多缝构件(14)的移动,由凹面光栅(16)衍射并指向检测器单元的物镜(2)移动。

著录项

  • 公开/公告号AU7779201A

    专利类型

  • 公开/公告日2002-02-18

    原文格式PDF

  • 申请/专利权人 YUIL ENGINEERING CORP;

    申请/专利号AU20010077792

  • 发明设计人 BONG-IL JI;JONG-SU CHOI;

    申请日2001-08-07

  • 分类号G02B27/42;

  • 国家 AU

  • 入库时间 2022-08-22 00:39:09

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