Apparatus for measuring thermal properties of a material surface and applying to thermomechanical modification using a peltier tip

摘要

The present invention relates to a scanning thermal microscope (scanning thermal microscope) inspection, the heat source at the same time the temperature sensor, the Peltier meter (Peltier tip) sample thermal property measurement apparatus and heat-setting of the surface (thermomechanical modification) using the device.; According to the invention the space of each heat characteristic of the sample surface, using a different conductive junction line of the meter reading of a scanning thermal microscope as heat source at the same time, a temperature sensor, by using the heat exchange characteristic only occurs junction nanometers configured in the bridge circuit, It can be measured with a resolution and sensitivity, heat from the Peltier meter reading at the time of thermoforming, since the cooling is possible at the same time it is possible to expect the improvement of the high spatial resolution thermoforming and heat-rate of the application to nano-recording medium (nano-storage media) It can be.