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Method for Burn-In in APC Mode Using Calibrated Internal Monitor Photo Diode
Method for Burn-In in APC Mode Using Calibrated Internal Monitor Photo Diode
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机译:使用校准的内部监控光电二极管在APC模式下老化的方法
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摘要
PURPOSE: A burn-in method in an APC(Automatic Power Control) mode using a photo diode interval monitor correction is provided to test reliability of a laser diode by using adverse conditions such as a temperature and an electric handicap. CONSTITUTION: An insertion state of an LD is checked by applying electrical signals to each channel under an ACC state of a temperature of 25 degrees centigrade. A falling point of a laser output and a distribution of an optical output are calculated by analyzing a correlation between an optical output and a varied current value of the laser diode under an ACC SCHMOO PLOT state of a temperature of 25 degrees centigrade. A lifetime of a laser diode is checked and recorded by applying an electric handicap and monitoring an electric condition of the laser diode under an APC state of a temperature of 85 degrees centigrade. A falling point of the laser output and a distribution of the optical output are calculated by analyzing a correlation between the varied current value of the laser diode and the optical output under an ACC state of a temperature of 85 degrees centigrade. A falling point of the laser output and a distribution of the optical output are calculated by analyzing a correlation between the varied current value of the laser diode and the optical output under an ACC SCHMOO PLOT state of a temperature of 25 degrees centigrade.
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