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- Single - electron memory device using the electron - hole coupling

机译:-使用电子-空穴耦合的单电子存储器件

摘要

The invention correlated single-electron penetration (Correlated Single Electron Tunneling) a blend of two or more quantum dots through the bonding arrangement shown the symptoms, and the time induced electrons-hole pairs (Electron-Hole Pair) Coulomb prevent horizontal (Coulomb Blockade of ) to provide a memory device using the phenomenon it is an object.; According to the invention, the electron-in single-electron memory device using the Coulomb horizontal prevent developer (Coulomb Blockade Phenomena) by the hole pairs includes at least two quantum dots through the bonding arrangement, the quantum dots through joint arrangement each of at least two consists of a through-bonded, and is arranged in parallel to each other are electrically coupled off significantly than a predetermined coupling force, a bond joint surfaces of the electron mobility and distant from each other not to occur in; Any one of the quantum dots through the bonding arrangement is electron-source and capable of applying the drain voltage-, the quantum dot through joint arrangement each of the source and a gate electrode for applying a gate voltage that can change the number of hole pairs the single-electron memory element, characterized in that made in a drain terminal is provided.
机译:本发明通过键合布置使单电子渗透(相关单电子隧穿)的两个或多个量子点的混合物相关联,表现出症状,并且时间感应的电子-空穴对(电子-空穴对)库仑阻止了水平的(库仑阻塞)。 )提供一种使用该存储对象的现象的存储设备。根据本发明,使用通过孔对的库仑水平防止显影剂(库仑阻挡现象)的电子输入单电子存储装置包括通过结合布置的至少两个量子点,通过结合布置的量子点中的至少每个两者由贯通键合构成,并且彼此平行地布置,以比预定的耦合力大的电耦合断开,键合面上的电子迁移率彼此不相距并且不发生。通过结合布置的任何量子点是电子源并且能够施加漏极电压,通过共同布置源和栅电极中的每一个的量子点通过接合布置来施加可改变空穴对数量的栅极电压。单电子存储元件,其特征在于,设置在漏极端子上。

著录项

  • 公开/公告号KR100325689B1

    专利类型

  • 公开/公告日2002-02-25

    原文格式PDF

  • 申请/专利权人 NULL NULL;

    申请/专利号KR19990054157

  • 发明设计人 신민철;이성재;박경완;

    申请日1999-12-01

  • 分类号G11C11/404;

  • 国家 KR

  • 入库时间 2022-08-22 00:29:54

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