Semiconductor testing system having advanced test ability

摘要

Having improved ability to test a semiconductor test apparatus. Such a semiconductor test apparatus includes a tester main frame including a formatter for normal and high speed for therein; And the signals required to further operate at a high speed for the semiconductor device in order to improve the normal pin drivers and, testing capabilities of the device operating at a first frequency of the semiconductor device to apply signals for testing a semiconductor device the high speed pin driver has to apply to operate at a higher second frequency than the first frequency, the tester as by a test head connected to the main frame, the test capability is improved rise factor in equipment costs are minimized.