TUNABLE SPECKLE-INTERFEROMETRIC RESOLUTION METER

摘要

FIELD: test of light-sensitive materials. SUBSTANCE: invention is related to resolution meters employing coherent light sources. Proposed resolution meter has source of coherent radiation, shutter, objective, diffuse scatterer, platform with angle reading unit mounted for rotation through preset angle around axis perpendicular to plane of specimen, adjusting device for displacement of diffuse scatterer along optical axis of objective which secures capability to vary characteristic sizes of speckles. EFFECT: enhanced productivity, potential for automatization and expanded range of tested light-sensitive materials. 1 dwg