首页> 外国专利> Heterostructure FET consists of a silicon/silicon-germanium heterostructure layer arrangement with a gate contact zone formed as a pn- or np-diode contact made of semiconductor material

Heterostructure FET consists of a silicon/silicon-germanium heterostructure layer arrangement with a gate contact zone formed as a pn- or np-diode contact made of semiconductor material

机译:异质结构FET由硅/硅锗锗异质结构层结构组成,栅接触区形成为由半导体材料制成的pn或np二极管接触

摘要

Heterostructure FET consists of a silicon/silicon-germanium heterostructure layer arrangement with source, drain and gate contact zones formed on a silicon substrate (1). The gate contact zone is formed as a pn- or np-diode contact (6, 7) made of semiconductor material. Preferred Features: The heterostructure layer arrangement is a modulation-doped FET with at least one conducting channel which is p- or n-conducting. The heterostructure layer arrangement consists of a buffer layer (2) made of Si/Ge alloy, a first supply layer (3) made of an n-doped Si/Ge alloy with an undoped region, an undoped silicon conducting layer (4), a second supply layer (5) with an undoped and an n-doped Si/Ge alloy, an undoped or slightly doped first diode layer (6) made of silicon, and a p+-doped diode layer (7) made of silicon with source and drain contact metallizations.
机译:异质结构FET由硅/硅锗锗异质结构层结构组成,在硅衬底(1)上形成源极,漏极和栅极接触区。栅极接触区形成为由半导体材料制成的pn或np二极管接触(6、7)。优选特征:异质结构层布置是具有至少一个p或n导电沟道的调制掺杂的FET。异质结构层布置包括由Si / Ge合金制成的缓冲层(2),由具有未掺杂区域的n掺杂Si / Ge合金制成的第一供应层(3),未掺杂的硅导电层(4),具有未掺杂和n掺杂的Si / Ge合金的第二供应层(5),由硅制成的未掺杂或稍微掺杂的第一二极管层(6)以及由硅制成的p +掺杂的二极管层(7)源极和漏极接触金属化。

著录项

  • 公开/公告号DE10026553A1

    专利类型

  • 公开/公告日2002-02-14

    原文格式PDF

  • 申请/专利权人 DAIMLERCHRYSLER AG;

    申请/专利号DE2000126553

  • 发明设计人 SEILER ULRICH;

    申请日2000-05-27

  • 分类号H01L29/808;H01L29/778;

  • 国家 DE

  • 入库时间 2022-08-22 00:27:44

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