首页> 外国专利> Double resistance strain gage arrangement for shear force stress detection, has meander shaped resistance strain gages, each comprising two measurement guides arranged diagonally in opposition on support, at specified angle

Double resistance strain gage arrangement for shear force stress detection, has meander shaped resistance strain gages, each comprising two measurement guides arranged diagonally in opposition on support, at specified angle

机译:用于剪切力应力检测的双电阻应变计装置,具有曲折形的电阻应变计,每个应变计均包括两个测量导轨,以对角线相对设置在支撑上,并以指定角度

摘要

Two pairs of meander shaped resistance strain gages (10,12,11,13) each consisting of two measurement grids (18), are arranged diagonally in opposition on a support (14). Each pair of strain gages are aligned at 90 deg angle, such that the measurement grid has an angle of 45 deg with respect to outer edge.
机译:两对曲折形的电阻应变计(10、12、11、13)分别由两个测量栅格(18)组成,它们对角地相对设置在支架(14)上。每对应变计以90度角对齐,以使测量网格相对于外边缘成45度角。

著录项

  • 公开/公告号DE10040287A1

    专利类型

  • 公开/公告日2002-02-28

    原文格式PDF

  • 申请/专利权人 HBM MES- UND SYSTEMTECHNIK GMBH;

    申请/专利号DE2000140287

  • 发明设计人 NOLD WERNER;ANDRAE JUERGEN;

    申请日2000-08-17

  • 分类号G01L1/22;G01L9/04;

  • 国家 DE

  • 入库时间 2022-08-22 00:27:33

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