Semiconductor memory device has word configuration selection stage that selects word configuration for normal mode from number of configurations if deactivated test mode signal input

摘要

The device has a test mode recognition circuit that deactivates a test mode signal in normal mode and activates in response to an externally supplied test mode determination signal. A word configuration selection stage (8) selects a word configuration for use in normal mode from a number of configurations if the deactivated test mode signal is input. Data are entered and output on the basis of the selected word configuration.