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Semiconductor memory with built-in test function provided by random number generator with comparison of random number data values entered in parallel in different memory banks
Semiconductor memory with built-in test function provided by random number generator with comparison of random number data values entered in parallel in different memory banks
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机译:随机数发生器提供具有内置测试功能的半导体存储器,并比较在不同存储库中并行输入的随机数数据值
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摘要
The semiconductor memory has a random number generator (20) providing random number values in parallel for the memory banks (11,12,13,14) of the memory cell field (10), with comparison of the entered data values read out from the different memory banks, for allowing a fault signal to be provided.
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