首页> 外国专利> Time-of-flight mass spectrometer for analyzing dimensionally separated specimens on a specimen mount uses laser desorption with a pulsed laser and ion detectors with temporary high resolution for measuring ionic currents.

Time-of-flight mass spectrometer for analyzing dimensionally separated specimens on a specimen mount uses laser desorption with a pulsed laser and ion detectors with temporary high resolution for measuring ionic currents.

机译:飞行时间质谱仪用于分析样品架上尺寸分离的样品,它使用脉冲激光激光解吸和具有临时高分辨率的离子检测器来测量离子电流。

摘要

A beam splitter (2) splits a laser beam from a pulsed laser (1). Split laser beams are deflected onto specimens on a specimen mount (5) via two fixed mirrors (3,4). A lens/mirror (3) acting as a concave mirror focuses the laser beams. Nine specimens fit in a focusing grid and are ionized simultaneously by laser pulses. A focusing aperture system (6) draws off the ions of the nine specimens to form ion beams. An Independent claim is also included for a method for analyzing specimens in a time-of-flight mass spectrometer by using laser desorption with a pulsed laser.
机译:分束器(2)分离来自脉冲激光器(1)的激光束。分离的激光束通过两个固定镜(3,4)偏转到样品架(5)上的样品上。用作凹面镜的透镜/镜(3)聚焦激光束。九个样本安装在聚焦栅格中,并通过激光脉冲同时电离。聚焦光圈系统(6)抽出9个样品的离子以形成离子束。还包括通过使用脉冲激光的激光解吸在飞行时间质谱仪中分析样品的方法的独立权利要求。

著录项

  • 公开/公告号DE10112386A1

    专利类型

  • 公开/公告日2002-10-02

    原文格式PDF

  • 申请/专利权人 BRUKER DALTONIK GMBH;

    申请/专利号DE2001112386

  • 发明设计人 FRANZEN JOCHEN;HOLLE ARMIN;

    申请日2001-03-15

  • 分类号H01J49/14;

  • 国家 DE

  • 入库时间 2022-08-22 00:27:02

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