IC chip testing method compares voltage applied to one supply voltage terminal of each tested IC chip with detected voltage at different supply voltage terminal of IC chip

摘要

The testing method uses a contact card (40) for application of a test voltage to one of the supply voltage terminals of each of a number of IC chips (12) incorporated in a semiconductor wafer (10) and measurement of the voltage at a second supply voltage terminal of each IC chip, for comparison with the applied voltage, for acceptance or rejection of the IC chip.