首页> 外国专利> Illumination unit preferably for a microscope, in particular, a UV microscope comprises a reflection filter arrangement whose entry and exit beams are translationally and/or angularly offset relative to one another

Illumination unit preferably for a microscope, in particular, a UV microscope comprises a reflection filter arrangement whose entry and exit beams are translationally and/or angularly offset relative to one another

机译:优选用于显微镜,尤其是UV显微镜的照明单元包括反射滤光器装置,其入射光束和出射光束相对于彼此平移和/或成角度地偏移

摘要

The illumination unit preferably for a microscope, in particular, a UV microscope comprises a reflection filter arrangement whose entry and exit beams (11, 12) are translationally and/or angularly offset relative to one another. An Independent claim is also included for a microscope, in particular a semiconductor inspection or measuring microscope with such an illumination unit.
机译:优选用于显微镜,尤其是紫外线显微镜的照明单元包括反射滤光器装置,其入射和出射光束(11、12)相对于彼此平移和/或成角度地偏移。还包括显微镜的独立权利要求,特别是具有这种照明单元的半导体检查或测量显微镜。

著录项

  • 公开/公告号DE10119992A1

    专利类型

  • 公开/公告日2002-10-24

    原文格式PDF

  • 申请/专利权人 LEICA MICROSYSTEMS WETZLAR GMBH;

    申请/专利号DE2001119992

  • 发明设计人 DANNER LAMBERT;VEITH MICHAEL;

    申请日2001-04-23

  • 分类号G02B21/16;

  • 国家 DE

  • 入库时间 2022-08-22 00:27:00

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