Complex design validation method for system-on-chip integrated circuit, involves feedbacking modified vectors to EDA environment to modify IC design data so as to correct design errors

摘要

Event based test vectors derived from integrated circuit (IC) design data are applied to prototype silicon by an event based test system. The vectors are modified by the system to acquire desired response outputs from the silicon prototype. The modified vectors are fed back to a EDA environment to modify the IC design data so as to correct the design errors.