首页> 外国专利> Locating defect in electric conductor covered by medium by applying voltage to cause heating and monitoring with infrared camera

Locating defect in electric conductor covered by medium by applying voltage to cause heating and monitoring with infrared camera

机译:通过施加电压引起加热并用红外热像仪监控,以定位被介质覆盖的电导体中的缺陷

摘要

A voltage is applied to the electrical conductor (4) to cause heating in the region of the defect (3). The heating can be detected through the medium covering the electrical conductor using a thermography device (14) such as an infrared camera. The voltage may be between 1000 and 10000 V. The electrical conductor may be arranged under plaster or within a walled-in surface. An independent claim is included for an apparatus for locating a detect in an electrical conductor.
机译:将电压施加到电导体(4),以在缺陷(3)的区域中引起加热。可以使用诸如红外热像仪之类的热成像装置(14)通过覆盖导电体的介质来检测热量。电压可以在1000到10000 V之间。电导体可以布置在灰泥下或内壁表面内。包括用于在电导体中定位检测的设备的独立权利要求。

著录项

  • 公开/公告号DE10201973A1

    专利类型

  • 公开/公告日2002-08-01

    原文格式PDF

  • 申请/专利权人 SANDVOSS ROLF;

    申请/专利号DE2002101973

  • 发明设计人 SANDVOSS ROLF;

    申请日2002-01-19

  • 分类号G01R31/08;G01J1/42;G01N27/00;G01J1/10;G01N25/72;

  • 国家 DE

  • 入库时间 2022-08-22 00:26:44

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