首页> 外国专利> An apparatus for testing the insensitivity to electromagnetic interference and the apparatus for irradiating of radio waves for the resistance test insensitive

An apparatus for testing the insensitivity to electromagnetic interference and the apparatus for irradiating of radio waves for the resistance test insensitive

机译:用于测试对电磁干扰的不敏感性的设备和用于电阻测试的对无线电不敏感的辐射设备

摘要

The invention provides an apparatus for measuring an electromagnetic wave stress of an article (6) including an electromagnetic wave irradiation unit (1) comprising a plurality of radiation probes being so arranged as adjacent to each other and approximately along a surface of the article (6) at least in one side thereof so as to permit the probes to irradiate independently electromagnetic waves on divided local areas in a surface of the article (6) and the divided local areas corresponding to the probes. The apparatus also includes a control unit being electrically connected to the article for receiving output signals having informations as to existences of any abnormalitie in individual divided local areas in the article exposed to an electromagnetic wave irradiation, the control unit (3) being electrically connected to the transmitter unit for controlling operations of the transmitter unit to control independently an excitation of each of the radiation probe.
机译:本发明提供一种用于测量物品(6)的电磁波应力的设备,该设备包括电磁波辐照单元(1),该电磁波辐照单元包括多个辐射探针,所述多个辐射探针彼此相邻并且大致沿着物品(6)的表面布置。至少在其一侧)以允许探针在物品(6)的表面中的分开的局部区域和对应于探针的分开的局部区域上独立地辐射电磁波。该设备还包括控制单元,该控制单元电连接到该物品,用于接收输出信号,该输出信号具有关于暴露于电磁波照射的物品的各个分开的局部区域中是否存在异常的信息,该控制单元(3)电连接到该物品。发射器单元,用于控制发射器单元的操作,以独立地控制每个辐射探针的激发。

著录项

  • 公开/公告号DE69427887T2

    专利类型

  • 公开/公告日2002-04-11

    原文格式PDF

  • 申请/专利权人 NEC CORP. TOKIO/TOKYO;

    申请/专利号DE1994627887T

  • 发明设计人 HARADA TAKASHI;HANDA EIJI;

    申请日1994-05-24

  • 分类号G01R31/302;

  • 国家 DE

  • 入库时间 2022-08-22 00:25:42

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