Determination of the form of a sample by the measurement of the slope of a surface by means of a scanning electron microscopy has

• 1. 白光干涉测量样品表面形状精细分布的方法及其装置 [P] . 中国专利： CN101324422B . 2011.01.19
• 2. 白光干涉测量样品表面形状精细分布的方法及其装置 [P] . 中国专利： CN101324422A . 2008-12-17
• 3. Sample shape determination by measurement of surface slope with a scanning electron microscope [P] . 美国专利： US6157032A . 2000-12-05

  机译： 通过使用扫描电子显微镜测量表面斜率来确定样品形状

• 4. Method of performing surface measurements on a surface of a sample, and scanning probe microscopy system therefore [P] . 美国专利： US10697998B2 . 2020-06-30

  机译： 因此，在样品的表面上进行表面测量的方法以及扫描探针显微镜系统

• 5. METHOD OF PERFORMING SURFACE MEASUREMENTS ON A SURFACE OF A SAMPLE, AND SCANNING PROBE MICROSCOPY SYSTEM THEREFORE [P] . 美国专利： US2018306837A1 . 2018-10-25

  机译： 在样品表面上进行表面测量的方法及其所用的扫描探针显微镜系统

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• 1. In situ scanning electron microscopy observation of deformation and fracture behavior of Ti-3Zr-2Sn-3Mo-25Nb alloy [J] . Ma Xiqun ,Yu Zhentao ,Han Yong . 稀有金属：英文版 . 2012,第4期
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• 3. Short Communication—A Novel Sample Preparation Method That Enables Ultrathin Sectioning of Urea-Formaldehyde Resin for Imaging by Transmission Electron Microscopy [J] . Adya P. Singh ,Arif Nuryawan ,Byung- Dae Park . 显微镜研究（英文） . 2013,第1期
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